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- W2088341799 abstract "Silicon carbide mirror blank materials were characterized using ultrasound phased array technology todetermine the feasibility of using this method for rapidly characterizing material homogeneity and locate anomalousflaws. A 10MHz 64 element linear probe was used to measure and image the top and bottom surface reflected signalpeak amplitudes. C-scan images located the presence of possible sub-surface heterogeneities as well as surface scratchesinvisible to the eye. Bottom surface scans located variations in homogeneity within the sample bulk. High frequencyultrasound phased array was found to be well suited for detailed characterization of SiC mirror blanks." @default.
- W2088341799 created "2016-06-24" @default.
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- W2088341799 date "2009-08-20" @default.
- W2088341799 modified "2023-09-23" @default.
- W2088341799 title "High frequency ultrasound phased array characterization of SiC mirror blanks" @default.
- W2088341799 doi "https://doi.org/10.1117/12.825096" @default.
- W2088341799 hasPublicationYear "2009" @default.
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