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• W2088355890 abstract "Applications of surface-sensitive analytical techniques (Auger electron, X-ray photoelectron, ion scattering and secondary ion mass spectroscopies) in research and development for electronic materials and devices are illustrated. These analytical techniques have been used in all phases of the electronics industry, and their importance and applications are expected to continue to increase." @default.
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• W2088355890 date "1969-05-01" @default.
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• W2088355890 title "Thin reaction layers and the surface structure of silicon (111)" @default.
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• W2088355890 doi "https://doi.org/10.1016/0039-6028(69)90073-9" @default.
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