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- W2088459964 abstract "Abstract Iron phthalocyanine (FePc) thin films grown by molecular beam epitaxy have been studied using slow positron beam and atomic force microscopy (AFM) techniques. A correlation between microstructure investigated using these two techniques as a function of film thickness (50‐140 nm) and crystallinity (amorphous and crystalline) is examined. Doppler broadening measurements revealed higher S‐parameter in amorphous film indicating more defects as compared to crystalline film. For crystalline films, as the thickness increases the S‐parameter increases, indicating the defect densities (free volume for positron annihilation) increases. However, AFM studies show that thinner film has columnar grains that transform to granular form with increase in thickness. The former shows wider grain boundaries which can not be sensed by positron. On the other hand, it reveals that columnar grains are more orderly arranged with small free volume inside the grain. (© 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)" @default.
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- W2088459964 date "2009-11-01" @default.
- W2088459964 modified "2023-10-03" @default.
- W2088459964 title "Study of iron phthalocyanine organic semiconductor thin films using slow positron beam" @default.
- W2088459964 doi "https://doi.org/10.1002/pssc.200982087" @default.
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