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- W2088893985 abstract "Abstract There is an increasing demand to obtain XPS analyses from smaller sample areas. The development of a transmission x‐ray photoelectron spectrometer will allow spectrum acquisition and imaging with a lateral resolution of approaching 1 μm 2 . The principle is based on back‐foil excitation where thin samples were placed on an aluminium foil. Electron irradiation of the foil produced x‐rays locally and this, in turn, gave rise to a small source of photoelectrons from the opposite side of the sample. Rastering the electron beam scanned the x‐ray interaction volume, which allowed imaging. Photoelectron lateral resolution was dependent on the sample and foil thicknesses and was determined by the x‐ray excitation volume. In this work a VG Scientific MA500 was modified to give the ideal 180° geometry for transmission x‐ray photoelectron spectroscopy (TXPS). A hemispherical analyser with an extended high‐magnification transfer lens ensured a large solid angle of photoelectron collection and the hemispherical analyser gave the, previously unobtainable, energy resolution necessary to obtain chemical state information. Certain aspects unique to TXPS and image interpretation are described, following discussions of spectral interpretation in the previous paper. It is believed that the local production of x‐rays by a scanning electron beam is the ideal way to examine the ultramicrotomed sections through interfaces and soft composite materials. Harder materials, such as ceramics and metals, require ion beam thinning in a similar way to transmission electron microscopy specimens. A magnesium–aluminium alloy is ion beam thinned to demonstrate TXPS from a harder material. The interlayer between a chlorine‐containing latex and mild steel is also analysed by TXPS following the removal of the bulk substrate and ultramicrotomy. This illustrated the applications in adhesion science, sample stability under analysis and localization of point analyses." @default.
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- W2088893985 title "Development and practical application of a transmission x-ray photoelectron spectrometer" @default.
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- W2088893985 doi "https://doi.org/10.1002/sia.740210610" @default.
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