FRINK Linked Data Fragments server

Matches in SemOpenAlex for { <https://semopenalex.org/work/W2089823118> ?p ?o ?g. }

• W2089823118 endingPage "3177" @default.
• W2089823118 startingPage "3160" @default.
• W2089823118 abstract "Amorphous selenium (a-Se) based real-time flat-panel imagers (FPIs) are finding their way into the digital radiology department because they offer the practical advantages of digital x-ray imaging combined with an image quality that equals or outperforms that of conventional systems. The temporal imaging characteristics of FPIs can be affected by ghosting (i.e., radiation-induced changes of sensitivity) when the dose to the detector is high (e.g., portal imaging and mammography) or the images are acquired at a high frame rate (e.g., fluoroscopy). In this paper, the x-ray time-of-flight (TOF) method is introduced as a tool for the investigation of ghosting in a-Se photoconductor layers. The method consists of irradiating layers of a-Se with short x-ray pulses. From the current generated in the a-Se layer, ghosting is quantified and the ghosting parameters (charge carrier generation rate and carrier lifetimes and mobilities) are assessed. The x-ray TOF method is novel in that (1) x-ray sensitivity (S) and ghosting parameters can be measured simultaneously, (2) the transport of both holes and electrons can be isolated, and (3) the method is applicable to the practical a-Se layer structure with blocking contacts used in FPIs. The x-ray TOF method was applied to an analysis of ghosting in a-Se photoconductor layers under portal imaging conditions, i.e., 1 mm thick a-Se layers, biased at 5 V/ microm, were irradiated using a 6 MV LINAC x-ray beam to a total dose (ghosting dose) of 30 Gy. The initial sensitivity (S0) of the a-Se layers was 63 +/- 2 nC cm(-2) cGy(-1). It was found that S decreases to 30% of S0 after a ghosting dose of 5 Gy and to 21% after 30 Gy at which point no further change in S occurs. At an x-ray intensity of 22 Gy/s (instantaneous dose rate during a LINAC x-ray pulse), the charge carrier generation rate was 1.25 +/- 0.1 x 10(22) ehp m(-3) s(-1) and, to a first approximation, independent of the ghosting dose. However, both hole and electron transport showed a strong dependence on the ghosting dose: hole transport decreased by 61%, electron transport by up to approximately 80%. Therefore, degradation of both hole and electron transport due to the recombination of mobile charge carriers with trapped carriers (of opposite polarity) were identified as the main cause of ghosting in this study." @default.
• W2089823118 created "2016-06-24" @default.
• W2089823118 creator A5035505963 @default.
• W2089823118 creator A5065544971 @default.
• W2089823118 creator A5084805417 @default.
• W2089823118 date "2005-09-29" @default.
• W2089823118 modified "2023-10-15" @default.
• W2089823118 title "The x‐ray time of flight method for investigation of ghosting in amorphous selenium‐based flat panel medical x‐ray imagers" @default.
• W2089823118 cites W1967893983 @default.
• W2089823118 cites W1968336458 @default.
• W2089823118 cites W1974284647 @default.
• W2089823118 cites W1978831503 @default.
• W2089823118 cites W1980226985 @default.
• W2089823118 cites W1987241296 @default.
• W2089823118 cites W1987327314 @default.
• W2089823118 cites W1991217501 @default.
• W2089823118 cites W1997651407 @default.
• W2089823118 cites W2000338333 @default.
• W2089823118 cites W2011547281 @default.
• W2089823118 cites W2012807147 @default.
• W2089823118 cites W2018318965 @default.
• W2089823118 cites W2018772040 @default.
• W2089823118 cites W2023194998 @default.
• W2089823118 cites W2023946773 @default.
• W2089823118 cites W2034044518 @default.
• W2089823118 cites W2038807916 @default.
• W2089823118 cites W2039404204 @default.
• W2089823118 cites W2044269888 @default.
• W2089823118 cites W2046877085 @default.
• W2089823118 cites W2058609535 @default.
• W2089823118 cites W2059214102 @default.
• W2089823118 cites W2061071868 @default.
• W2089823118 cites W2064035035 @default.
• W2089823118 cites W2080746674 @default.
• W2089823118 cites W2088033190 @default.
• W2089823118 cites W2092752778 @default.
• W2089823118 cites W2098638061 @default.
• W2089823118 cites W2156256714 @default.
• W2089823118 cites W4247958424 @default.
• W2089823118 cites W4377836891 @default.
• W2089823118 doi "https://doi.org/10.1118/1.2042248" @default.
• W2089823118 hasPubMedId "https://pubmed.ncbi.nlm.nih.gov/16279070" @default.
• W2089823118 hasPublicationYear "2005" @default.
• W2089823118 type Work @default.
• W2089823118 sameAs 2089823118 @default.
• W2089823118 citedByCount "27" @default.
• W2089823118 countsByYear W20898231182012 @default.
• W2089823118 countsByYear W20898231182013 @default.
• W2089823118 countsByYear W20898231182015 @default.
• W2089823118 countsByYear W20898231182016 @default.
• W2089823118 countsByYear W20898231182018 @default.
• W2089823118 countsByYear W20898231182019 @default.
• W2089823118 countsByYear W20898231182020 @default.
• W2089823118 countsByYear W20898231182021 @default.
• W2089823118 countsByYear W20898231182022 @default.
• W2089823118 crossrefType "journal-article" @default.
• W2089823118 hasAuthorship W2089823118A5035505963 @default.
• W2089823118 hasAuthorship W2089823118A5065544971 @default.
• W2089823118 hasAuthorship W2089823118A5084805417 @default.
• W2089823118 hasConcept C115961682 @default.
• W2089823118 hasConcept C120665830 @default.
• W2089823118 hasConcept C121332964 @default.
• W2089823118 hasConcept C126838900 @default.
• W2089823118 hasConcept C146108262 @default.
• W2089823118 hasConcept C154945302 @default.
• W2089823118 hasConcept C192562407 @default.
• W2089823118 hasConcept C2776805002 @default.
• W2089823118 hasConcept C2779328170 @default.
• W2089823118 hasConcept C2780531524 @default.
• W2089823118 hasConcept C2989005 @default.
• W2089823118 hasConcept C41008148 @default.
• W2089823118 hasConcept C55020928 @default.
• W2089823118 hasConcept C71924100 @default.
• W2089823118 hasConcept C94915269 @default.
• W2089823118 hasConceptScore W2089823118C115961682 @default.
• W2089823118 hasConceptScore W2089823118C120665830 @default.
• W2089823118 hasConceptScore W2089823118C121332964 @default.
• W2089823118 hasConceptScore W2089823118C126838900 @default.
• W2089823118 hasConceptScore W2089823118C146108262 @default.
• W2089823118 hasConceptScore W2089823118C154945302 @default.
• W2089823118 hasConceptScore W2089823118C192562407 @default.
• W2089823118 hasConceptScore W2089823118C2776805002 @default.
• W2089823118 hasConceptScore W2089823118C2779328170 @default.
• W2089823118 hasConceptScore W2089823118C2780531524 @default.
• W2089823118 hasConceptScore W2089823118C2989005 @default.
• W2089823118 hasConceptScore W2089823118C41008148 @default.
• W2089823118 hasConceptScore W2089823118C55020928 @default.
• W2089823118 hasConceptScore W2089823118C71924100 @default.
• W2089823118 hasConceptScore W2089823118C94915269 @default.
• W2089823118 hasIssue "10" @default.
• W2089823118 hasLocation W20898231181 @default.
• W2089823118 hasLocation W20898231182 @default.
• W2089823118 hasOpenAccess W2089823118 @default.
• W2089823118 hasPrimaryLocation W20898231181 @default.
• W2089823118 hasRelatedWork W1544796203 @default.
• W2089823118 hasRelatedWork W1965728255 @default.
• W2089823118 hasRelatedWork W1987327314 @default.
• W2089823118 hasRelatedWork W2109621718 @default.

• next