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- W2089867840 abstract "The aim of this article is to review the many available techniques in transmission electron microscopy, drawing attention to their particular characteristics and strengths. Where techniques are well established, the reader is referred to standard reference texts. Greater detail is given about new and emerging techniques which hold promise for even more detailed future study of semiconductor interfaces." @default.
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- W2089867840 date "1993-09-15" @default.
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- W2089867840 title "Probing semiconductor interfaces by transmission electron microscopy" @default.
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- W2089867840 doi "https://doi.org/10.1098/rsta.1993.0107" @default.
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