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• W2090096410 abstract "Zinc oxide films were deposited by method rf magnetron sputtering in a mixed environment of oxygen and argon on two types of substrates, glass and silicon substrates with different orientations, by varying the deposition parameters in order to obtain high-quality ZnO nanostructured layers. An atomic force microscope was used to measure the piezoelectricity in nanofibrous layers and poly [methyl (H) silane]. The interaction between the type of semiconductor /poly[methyl(H)silane] and the applied electric field has proved that thea given structures are piezoelectric materials useful for fabrication of optoelectronic devices." @default.
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• W2090096410 date "2012-10-01" @default.
• W2090096410 modified "2023-10-17" @default.
• W2090096410 title "Study of piezoelectrycity in structures based on nanofibrous ZnO layers and polysilane" @default.
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• W2090096410 doi "https://doi.org/10.1109/smicnd.2012.6400780" @default.
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