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- W2092180519 abstract "The compositional, crystal and microstructural, optical transmission and absorption properties of Zn <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>x</sub> Cd <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>1-x</sub> S thin films at low zinc (Zn) content (x=0.2) fabricated by RF co-sputtering using CdS and ZnS were investigated. These ternary compounds were characterized by energy dispersive X-ray analysis (EDX) for composition, X-ray diffraction (XRD) for crystal structure, UV-vis for optical study, forced emission scanning electron microscopy (FESEM) for surface morphology and atomic force microscopy (AFM) for surface topology. XRD patterns of Zn <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>x</sub> Cd <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>1-x</sub> S thin films showed the hexagonal structure with a strong reflection peak of (002) plane. From FESEM, the average grain size smaller than 40 nm was observed. Band gap of the films was determined to be 2.6 eV. The average and root mean square roughness of Zn <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>x</sub> Cd <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>1-x</sub> S (for x= 0.2) were checked by atomic force microscopy (AFM). The surface of the thin films was found to be smoother, homogenous and densely packed with uniform growth." @default.
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- W2092180519 date "2012-06-01" @default.
- W2092180519 modified "2023-10-18" @default.
- W2092180519 title "An analysis on structural and optical properties of Zn<inf>x</inf>Cd<inf>1−X</inf>S thin film deposited by RF magnetron sputtering" @default.
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- W2092180519 doi "https://doi.org/10.1109/pvsc.2012.6317590" @default.
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