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• W2092600400 endingPage "266" @default.
• W2092600400 startingPage "263" @default.
• W2092600400 abstract "Abstract We fabricated amorphous indium gallium zinc oxide thin film transistors (TFTs) in a top gate structure on a glass substrate. We investigated the effect of drain bias on the instability of the device. Although the device showed highly stable characteristics under both positive and negative gate bias stress, it showed significant degradation in the transfer characteristics under drain bias stress. The degradation phenomena are somewhat similar to those of negative gate bias illumination stress (NBIS). In the case of NBIS, degradation mechanisms have been confused between two kinds of illustrations, one of which is hole trapping in the gate insulator and the other is an increase of electron density in the active layer. Our experimental results revealed that the degradation mechanism of drain bias stress is closer to the latter mechanism of NBIS in amorphous oxide TFTs." @default.
• W2092600400 created "2016-06-24" @default.
• W2092600400 creator A5015799099 @default.
• W2092600400 creator A5017603106 @default.
• W2092600400 creator A5026758953 @default.
• W2092600400 creator A5032404988 @default.
• W2092600400 creator A5036427339 @default.
• W2092600400 creator A5037469285 @default.
• W2092600400 creator A5076572734 @default.
• W2092600400 date "2013-11-01" @default.
• W2092600400 modified "2023-10-18" @default.
• W2092600400 title "Drain bias effect on the instability of amorphous indium gallium zinc oxide thin film transistor" @default.
• W2092600400 cites W1966940769 @default.
• W2092600400 cites W1975215680 @default.
• W2092600400 cites W1985936082 @default.
• W2092600400 cites W1988163838 @default.
• W2092600400 cites W1998209596 @default.
• W2092600400 cites W1998922674 @default.
• W2092600400 cites W1999589524 @default.
• W2092600400 cites W2021997841 @default.
• W2092600400 cites W2040179822 @default.
• W2092600400 cites W2054170609 @default.
• W2092600400 cites W2064002754 @default.
• W2092600400 cites W2064679149 @default.
• W2092600400 cites W2097491775 @default.
• W2092600400 cites W2135954772 @default.
• W2092600400 cites W3101139446 @default.
• W2092600400 doi "https://doi.org/10.1016/j.tsf.2012.12.109" @default.
• W2092600400 hasPublicationYear "2013" @default.
• W2092600400 type Work @default.
• W2092600400 sameAs 2092600400 @default.
• W2092600400 citedByCount "7" @default.
• W2092600400 countsByYear W20926004002013 @default.
• W2092600400 countsByYear W20926004002015 @default.
• W2092600400 countsByYear W20926004002016 @default.
• W2092600400 countsByYear W20926004002018 @default.
• W2092600400 countsByYear W20926004002019 @default.
• W2092600400 countsByYear W20926004002023 @default.
• W2092600400 crossrefType "journal-article" @default.
• W2092600400 hasAuthorship W2092600400A5015799099 @default.
• W2092600400 hasAuthorship W2092600400A5017603106 @default.
• W2092600400 hasAuthorship W2092600400A5026758953 @default.
• W2092600400 hasAuthorship W2092600400A5032404988 @default.
• W2092600400 hasAuthorship W2092600400A5036427339 @default.
• W2092600400 hasAuthorship W2092600400A5037469285 @default.
• W2092600400 hasAuthorship W2092600400A5076572734 @default.
• W2092600400 hasConcept C119599485 @default.
• W2092600400 hasConcept C121332964 @default.
• W2092600400 hasConcept C127413603 @default.
• W2092600400 hasConcept C165801399 @default.
• W2092600400 hasConcept C171250308 @default.
• W2092600400 hasConcept C172385210 @default.
• W2092600400 hasConcept C185592680 @default.
• W2092600400 hasConcept C19067145 @default.
• W2092600400 hasConcept C191897082 @default.
• W2092600400 hasConcept C192562407 @default.
• W2092600400 hasConcept C207821765 @default.
• W2092600400 hasConcept C2779227376 @default.
• W2092600400 hasConcept C2779851234 @default.
• W2092600400 hasConcept C49040817 @default.
• W2092600400 hasConcept C535196362 @default.
• W2092600400 hasConcept C543292547 @default.
• W2092600400 hasConcept C550372918 @default.
• W2092600400 hasConcept C56052488 @default.
• W2092600400 hasConcept C57879066 @default.
• W2092600400 hasConcept C8010536 @default.
• W2092600400 hasConcept C87359718 @default.
• W2092600400 hasConceptScore W2092600400C119599485 @default.
• W2092600400 hasConceptScore W2092600400C121332964 @default.
• W2092600400 hasConceptScore W2092600400C127413603 @default.
• W2092600400 hasConceptScore W2092600400C165801399 @default.
• W2092600400 hasConceptScore W2092600400C171250308 @default.
• W2092600400 hasConceptScore W2092600400C172385210 @default.
• W2092600400 hasConceptScore W2092600400C185592680 @default.
• W2092600400 hasConceptScore W2092600400C19067145 @default.
• W2092600400 hasConceptScore W2092600400C191897082 @default.
• W2092600400 hasConceptScore W2092600400C192562407 @default.
• W2092600400 hasConceptScore W2092600400C207821765 @default.
• W2092600400 hasConceptScore W2092600400C2779227376 @default.
• W2092600400 hasConceptScore W2092600400C2779851234 @default.
• W2092600400 hasConceptScore W2092600400C49040817 @default.
• W2092600400 hasConceptScore W2092600400C535196362 @default.
• W2092600400 hasConceptScore W2092600400C543292547 @default.
• W2092600400 hasConceptScore W2092600400C550372918 @default.
• W2092600400 hasConceptScore W2092600400C56052488 @default.
• W2092600400 hasConceptScore W2092600400C57879066 @default.
• W2092600400 hasConceptScore W2092600400C8010536 @default.
• W2092600400 hasConceptScore W2092600400C87359718 @default.
• W2092600400 hasLocation W20926004001 @default.
• W2092600400 hasOpenAccess W2092600400 @default.
• W2092600400 hasPrimaryLocation W20926004001 @default.
• W2092600400 hasRelatedWork W1919032090 @default.
• W2092600400 hasRelatedWork W1965678562 @default.
• W2092600400 hasRelatedWork W1976807379 @default.
• W2092600400 hasRelatedWork W2066500912 @default.
• W2092600400 hasRelatedWork W2087826256 @default.
• W2092600400 hasRelatedWork W2148026427 @default.
• W2092600400 hasRelatedWork W2579142777 @default.

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