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• W2093234877 abstract "We demonstrate current-induced displacement of ferromagnetic domain walls in submicrometer fabricated patterns of SrRuO3 films. The displacement, monitored by measuring the extraordinary Hall effect, is induced at zero applied magnetic field and its direction is reversed when the current is reversed. We find that current density in the range of 10(9)-10(10) A/m2 is sufficient for domain-wall displacement when the depinning field varies between 50 to 500 Oe. These results indicate relatively high efficiency of the current in displacing domain walls which we believe is related to the narrow width (approximately 3 nm) of domain walls in this compound." @default.
• W2093234877 created "2016-06-24" @default.
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• W2093234877 date "2007-06-15" @default.
• W2093234877 modified "2023-10-15" @default.
• W2093234877 title "Efficient Current-Induced Domain-Wall Displacement in<mml:math xmlns:mml=http://www.w3.org/1998/Math/MathML display=inline><mml:msub><mml:mi>SrRuO</mml:mi><mml:mn>3</mml:mn></mml:msub></mml:math>" @default.
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• W2093234877 doi "https://doi.org/10.1103/physrevlett.98.247204" @default.
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