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- W2093305845 abstract "The paper presents an extended summary of the PhD thesis that tackles a low power decompression of test cubes in EDT environment and compaction of test responses in the presence of unknown states. The proposed low power decompression schemes allow one to reduce the load and unload switching activity by more than 93% and capture transitions by 52%. The X-masking scheme introduced in the thesis offers up to 48,000 x compression of control data, and eliminates all unknown states from test responses." @default.
- W2093305845 created "2016-06-24" @default.
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- W2093305845 date "2012-11-01" @default.
- W2093305845 modified "2023-09-23" @default.
- W2093305845 title "Low power test application with selective compaction in VLSI designs" @default.
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- W2093305845 doi "https://doi.org/10.1109/test.2012.6401532" @default.
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