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- W2093388440 abstract "The permanent ionizing radiation effects resulting from the use of dielectrics to bound FET structures have been experimentally determined for a total ionizing dose up to 108 rads (Si) and for various dielectric isolation techniques. The experimental vehicles used for making these determinations were dielectrically isolated JFET's operated in such a manner that they behaved as a combination junction-MOS field-effect transistor. The experimental results observed by measuring the saturation current, turn-off voltage, maximum transconductance, and channel conductance of the junction FET show a non-monotonic relationship in the effects of a positive charge build-up in the silicon dioxide isolation dielectric with increasing dose. A theoretical model is derived for calculating the interface charge density as a function of the measurable JFET device parameters." @default.
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- W2093388440 date "1973-01-01" @default.
- W2093388440 modified "2023-09-27" @default.
- W2093388440 title "Permanent Ionizing Radiation Effects in Dielectrically Bounded Field Effect Transistors" @default.
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- W2093388440 doi "https://doi.org/10.1109/tns.1973.4327387" @default.
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