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• W2093512890 abstract "Azimuthal X-ray photoelectron diffraction (APD) experiments have been carried out on a sample of Hg0.78Cd0.22 Te (MCT) epitaxially grown by liquid phase epitaxy (LPE) on (111) CdTe. To our knowledge this is the first XPD study of the (111) face of a II-VI semiconductor. Reproducible diffraction features are seen for emission from core levels of Hg, Cd and Te both before and after minimum ion bombardment, with bombardment being done to remove the native oxide overlayer. Single scattering cluster (SSC) calculations have been carried out using a spherical wave (SW) model. From comparison between experiment and theory an absolute determination of the surface polarity is possible." @default.
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• W2093512890 date "1990-06-01" @default.
• W2093512890 modified "2023-09-26" @default.
• W2093512890 title "Polarity determination of the HgCdTe(111) surface by azimuthal X-ray photoelectron diffraction experiments" @default.
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• W2093512890 doi "https://doi.org/10.1088/0031-8949/41/6/044" @default.
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