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- W2093743245 abstract "Abstract The microwave surface resistance R s at 10 GHz was measured for the epitaxial YBa 2 Cu 3 O 7− x films deposited on a MgO (001) substrate by the sputtering method. These films were completely oriented with the c -axis normal to the surface and the in-plane alignments were YBa 2 Cu 3 O 7− x [100]|MgO[100] and YBa 2 Cu 3 O 7− x [010]|MgO[100], having a little or no fraction of misaligned grains or domains with large-angle boundaries. The R s values of the films correlated with the domain size more strongly than with the fraction of misorientation, implying that the domain boundaries themselves, even if they were not large-angle domain boundaries, lead to the increase of the surface resistance. The weak couplings between the domains are considered to be the main cause of the increase in the microwave surface resistance." @default.
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- W2093743245 date "1995-11-01" @default.
- W2093743245 modified "2023-09-30" @default.
- W2093743245 title "Microwave surface resistance of epitaxial YBa2Cu3O7−x films" @default.
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- W2093743245 doi "https://doi.org/10.1016/0921-4534(95)00543-9" @default.
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