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• W2093940483 startingPage "1759" @default.
• W2093940483 abstract "The scanning tunneling microscope (STM) was used to quantitatively investigate nonequilibrium surfaces of graphite roughened by sputter etching with 5-keV Ar ions. The resulting surface morphology depended strongly on the ion flux and fluence, as well as the sample temperature. The height-correlation functions of the roughened surfaces were calculated directly from the STM topographs and compared to linear-response theory and scaling analyses for the propagation of growing fronts. The surfaces developed correlated structures characterized by a length that diverged with increasing ion fluence." @default.
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• W2093940483 date "1991-09-23" @default.
• W2093940483 modified "2023-10-18" @default.
• W2093940483 title "Submicron-scale surface roughening induced by ion bombardment" @default.
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• W2093940483 doi "https://doi.org/10.1103/physrevlett.67.1759" @default.
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