FRINK Linked Data Fragments server

Matches in SemOpenAlex for { <https://semopenalex.org/work/W2094485576> ?p ?o ?g. }

• W2094485576 endingPage "335" @default.
• W2094485576 startingPage "328" @default.
• W2094485576 abstract "The variation in the capacitance–voltage (C–V) and conductance–voltage (G/ω–V) characteristics of Au/SiO2/n-Si metal–insulator–semiconductor (MIS) structure have been systematically investigated as a function of frequencies in the frequency range 0.5 kHz–10 MHz at room temperature. In addition, the forward and reverse bias current–voltage (I–V) characteristics of this structure were measured at room temperature. The high value of ideality factor was attributed to the high density of interface states localized at Si/SiO2 interface and interfacial oxide layer. The density of interface states (Nss) and the series resistance (Rss) were calculated from I–V and C–V measurements using different methods and the effect of them on C–V and G/ω–V characteristics were deeply researched. At the same energy position near the top of valance band, the calculated Nss values, obtained without taking into account the series resistance of the devices almost one order of magnitude larger than Nss values obtained by taking into account Rss values. It is found that the C–V and G/ω–V curves exhibit a peak at low frequencies and the peak values of C and G/ω decrease with increasing frequency. Also, the plots of Rs as a function of bias give two peaks in the certain voltage range at low frequencies. These observations indicate that at low frequencies, the charges at interface states can easily follow an AC signal and the number of them increases with decreasing frequency. The I–V, C–V and G/ω–V characteristics of the MIS structure are affected not only with Rs but also Nss. Experimental results show that both the Rs and Co values should be taken into account in determining frequency-dependent electrical characteristics." @default.
• W2094485576 created "2016-06-24" @default.
• W2094485576 creator A5056991611 @default.
• W2094485576 creator A5091131669 @default.
• W2094485576 date "2007-04-01" @default.
• W2094485576 modified "2023-10-01" @default.
• W2094485576 title "On the profile of frequency and voltage dependent interface states and series resistance in MIS structures" @default.
• W2094485576 cites W130076233 @default.
• W2094485576 cites W1966258424 @default.
• W2094485576 cites W1966906670 @default.
• W2094485576 cites W1969161932 @default.
• W2094485576 cites W1970756123 @default.
• W2094485576 cites W1972614089 @default.
• W2094485576 cites W1975294125 @default.
• W2094485576 cites W1986545984 @default.
• W2094485576 cites W1988969637 @default.
• W2094485576 cites W1988990812 @default.
• W2094485576 cites W1991410827 @default.
• W2094485576 cites W1991973353 @default.
• W2094485576 cites W1995098301 @default.
• W2094485576 cites W1997283328 @default.
• W2094485576 cites W1998964407 @default.
• W2094485576 cites W1999868161 @default.
• W2094485576 cites W2001977314 @default.
• W2094485576 cites W2008736195 @default.
• W2094485576 cites W2016162937 @default.
• W2094485576 cites W2017085766 @default.
• W2094485576 cites W2017580926 @default.
• W2094485576 cites W2022328262 @default.
• W2094485576 cites W2027035588 @default.
• W2094485576 cites W2029705992 @default.
• W2094485576 cites W2033713540 @default.
• W2094485576 cites W2033985068 @default.
• W2094485576 cites W2038177641 @default.
• W2094485576 cites W2049311739 @default.
• W2094485576 cites W2053331364 @default.
• W2094485576 cites W2055665042 @default.
• W2094485576 cites W2070544679 @default.
• W2094485576 cites W2074821454 @default.
• W2094485576 cites W2079471989 @default.
• W2094485576 cites W2081744307 @default.
• W2094485576 cites W2081869101 @default.
• W2094485576 cites W2088277830 @default.
• W2094485576 cites W2090195004 @default.
• W2094485576 cites W2092078319 @default.
• W2094485576 cites W2115647685 @default.
• W2094485576 doi "https://doi.org/10.1016/j.physb.2007.01.020" @default.
• W2094485576 hasPublicationYear "2007" @default.
• W2094485576 type Work @default.
• W2094485576 sameAs 2094485576 @default.
• W2094485576 citedByCount "17" @default.
• W2094485576 countsByYear W20944855762013 @default.
• W2094485576 countsByYear W20944855762014 @default.
• W2094485576 countsByYear W20944855762015 @default.
• W2094485576 countsByYear W20944855762020 @default.
• W2094485576 countsByYear W20944855762021 @default.
• W2094485576 countsByYear W20944855762022 @default.
• W2094485576 crossrefType "journal-article" @default.
• W2094485576 hasAuthorship W2094485576A5056991611 @default.
• W2094485576 hasAuthorship W2094485576A5091131669 @default.
• W2094485576 hasConcept C113196181 @default.
• W2094485576 hasConcept C119599485 @default.
• W2094485576 hasConcept C121332964 @default.
• W2094485576 hasConcept C121932024 @default.
• W2094485576 hasConcept C127413603 @default.
• W2094485576 hasConcept C14485415 @default.
• W2094485576 hasConcept C147789679 @default.
• W2094485576 hasConcept C165801399 @default.
• W2094485576 hasConcept C17525397 @default.
• W2094485576 hasConcept C185592680 @default.
• W2094485576 hasConcept C192562407 @default.
• W2094485576 hasConcept C20254490 @default.
• W2094485576 hasConcept C26873012 @default.
• W2094485576 hasConcept C30066665 @default.
• W2094485576 hasConcept C43617362 @default.
• W2094485576 hasConceptScore W2094485576C113196181 @default.
• W2094485576 hasConceptScore W2094485576C119599485 @default.
• W2094485576 hasConceptScore W2094485576C121332964 @default.
• W2094485576 hasConceptScore W2094485576C121932024 @default.
• W2094485576 hasConceptScore W2094485576C127413603 @default.
• W2094485576 hasConceptScore W2094485576C14485415 @default.
• W2094485576 hasConceptScore W2094485576C147789679 @default.
• W2094485576 hasConceptScore W2094485576C165801399 @default.
• W2094485576 hasConceptScore W2094485576C17525397 @default.
• W2094485576 hasConceptScore W2094485576C185592680 @default.
• W2094485576 hasConceptScore W2094485576C192562407 @default.
• W2094485576 hasConceptScore W2094485576C20254490 @default.
• W2094485576 hasConceptScore W2094485576C26873012 @default.
• W2094485576 hasConceptScore W2094485576C30066665 @default.
• W2094485576 hasConceptScore W2094485576C43617362 @default.
• W2094485576 hasIssue "1-2" @default.
• W2094485576 hasLocation W20944855761 @default.
• W2094485576 hasOpenAccess W2094485576 @default.
• W2094485576 hasPrimaryLocation W20944855761 @default.
• W2094485576 hasRelatedWork W1435231659 @default.
• W2094485576 hasRelatedWork W1983646371 @default.
• W2094485576 hasRelatedWork W2016102890 @default.
• W2094485576 hasRelatedWork W2067091211 @default.

• next