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• W2094958740 abstract "Experimental techniques for precise determination of low tracer diffusion coefficients in solid metals and alloys using radioisotopes are reviewed. Sputter-microsectioning method is most useful to measure submicron diffusion profiles at low temperatures. Measurements of tracer diffusivity along grain boundaries and dislocations in iron and stainless steels from the analysis of type C kinetics as well as type B kinetics are discussed." @default.
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• W2094958740 date "2005-01-01" @default.
• W2094958740 modified "2023-10-16" @default.
• W2094958740 title "Precise Measurement of Low Diffusion Coefficients Using Radioactive Tracers" @default.
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• W2094958740 doi "https://doi.org/10.2320/jinstmet.69.321" @default.
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