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• W2095196131 abstract "The influence of the gauge volume size and shape on the analysis of steep near-surface residual stress gradients by means of energy-dispersive synchrotron diffraction is studied theoretically. Cases are considered where the irradiated sample volume is confined by narrow-slit systems, in both the primary and the diffracted beam, to dimensions comparable to the `natural' 1/ e information depth τ 1/ e of the X-rays. It is shown that the ratio between τ 1/e , defined by the material's absorption, and the immersion depth h GV of the gauge volume into the sample is the crucial parameter that shapes the d ψ hkl or ∊ ψ hkl versus sin 2 ψ distributions obtained in the Ψ mode of X-ray stress analysis. Since the actual information depth 〈 z 〉 GV to which the measured X-ray signal has to be assigned is a superposition of geometrical and exponential weighting functions, ambiguities in the conventional plot of the Laplace stresses versus 〈 z 〉 GV may occur for measurements performed using narrow-slit configurations. To avoid conflicts in data analysis in these cases, a modified formalism is proposed for the evaluation of the real space residual stress profiles σ || ( z ), which is based on a two-dimensional least-squares fit procedure." @default.
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• W2095196131 date "2013-05-04" @default.
• W2095196131 modified "2023-09-26" @default.
• W2095196131 title "Sin²ψ-based residual stress gradient analysis by energy-dispersive synchrotron diffraction constrained by small gauge volumes. I. Theoretical concept" @default.
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• W2095196131 doi "https://doi.org/10.1107/s0021889813008340" @default.
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