Matches in SemOpenAlex for { <https://semopenalex.org/work/W2096544402> ?p ?o ?g. }
- W2096544402 endingPage "39" @default.
- W2096544402 startingPage "19" @default.
- W2096544402 abstract "Over the last few years many ion beam techniques have been reported for the profiling of hydrogen in materials. We have evaluated nine of these using similar samples of hydrogen ion-implanted into silicon. When possible the samples were analysed using two or more techniques to confirm the ion-implanted accuracy. We report the results of this work which has produced a consensus profile of H in silicon which is useful as a calibration standard. The analytical techniques used have capabilities ranging from very high depth resolution (≈50 Å) and high sensitivity (< 1 ppm) to deep probes for hydrogen which can sample throughout thin sheets (up to 0.2 mm thick)." @default.
- W2096544402 created "2016-06-24" @default.
- W2096544402 creator A5003678760 @default.
- W2096544402 creator A5006839617 @default.
- W2096544402 creator A5012639421 @default.
- W2096544402 creator A5013446528 @default.
- W2096544402 creator A5019577418 @default.
- W2096544402 creator A5020168973 @default.
- W2096544402 creator A5022735365 @default.
- W2096544402 creator A5024436079 @default.
- W2096544402 creator A5025310668 @default.
- W2096544402 creator A5028136543 @default.
- W2096544402 creator A5028153588 @default.
- W2096544402 creator A5030287491 @default.
- W2096544402 creator A5031393112 @default.
- W2096544402 creator A5033536213 @default.
- W2096544402 creator A5036295864 @default.
- W2096544402 creator A5042796483 @default.
- W2096544402 creator A5043480115 @default.
- W2096544402 creator A5043774350 @default.
- W2096544402 creator A5046912164 @default.
- W2096544402 creator A5052089552 @default.
- W2096544402 creator A5065893705 @default.
- W2096544402 creator A5068584206 @default.
- W2096544402 creator A5073566939 @default.
- W2096544402 creator A5086522439 @default.
- W2096544402 creator A5086875698 @default.
- W2096544402 creator A5088783885 @default.
- W2096544402 creator A5089911516 @default.
- W2096544402 date "1978-02-01" @default.
- W2096544402 modified "2023-10-14" @default.
- W2096544402 title "Profiling hydrogen in materials using ion beams" @default.
- W2096544402 cites W1676901196 @default.
- W2096544402 cites W1963861791 @default.
- W2096544402 cites W1965516542 @default.
- W2096544402 cites W1965830591 @default.
- W2096544402 cites W1966337119 @default.
- W2096544402 cites W1970461900 @default.
- W2096544402 cites W1980173032 @default.
- W2096544402 cites W1986115354 @default.
- W2096544402 cites W1989673590 @default.
- W2096544402 cites W2009691034 @default.
- W2096544402 cites W2010817368 @default.
- W2096544402 cites W2011822398 @default.
- W2096544402 cites W2013737316 @default.
- W2096544402 cites W2014822646 @default.
- W2096544402 cites W2024448331 @default.
- W2096544402 cites W2033321189 @default.
- W2096544402 cites W2041928077 @default.
- W2096544402 cites W2042838209 @default.
- W2096544402 cites W2045315138 @default.
- W2096544402 cites W2045794530 @default.
- W2096544402 cites W2049809768 @default.
- W2096544402 cites W2054245753 @default.
- W2096544402 cites W2056907909 @default.
- W2096544402 cites W2073051752 @default.
- W2096544402 cites W2074143860 @default.
- W2096544402 cites W2083424523 @default.
- W2096544402 cites W2084583971 @default.
- W2096544402 cites W2084935994 @default.
- W2096544402 cites W2086411526 @default.
- W2096544402 cites W2094538990 @default.
- W2096544402 cites W2102838580 @default.
- W2096544402 cites W2103928723 @default.
- W2096544402 cites W2106366646 @default.
- W2096544402 cites W2146453008 @default.
- W2096544402 cites W2274398307 @default.
- W2096544402 cites W2322905830 @default.
- W2096544402 cites W3040972037 @default.
- W2096544402 cites W4301339925 @default.
- W2096544402 cites W2099241707 @default.
- W2096544402 doi "https://doi.org/10.1016/0029-554x(78)90834-0" @default.
- W2096544402 hasPublicationYear "1978" @default.
- W2096544402 type Work @default.
- W2096544402 sameAs 2096544402 @default.
- W2096544402 citedByCount "192" @default.
- W2096544402 countsByYear W20965444022013 @default.
- W2096544402 countsByYear W20965444022014 @default.
- W2096544402 countsByYear W20965444022016 @default.
- W2096544402 countsByYear W20965444022017 @default.
- W2096544402 countsByYear W20965444022019 @default.
- W2096544402 countsByYear W20965444022020 @default.
- W2096544402 countsByYear W20965444022021 @default.
- W2096544402 crossrefType "journal-article" @default.
- W2096544402 hasAuthorship W2096544402A5003678760 @default.
- W2096544402 hasAuthorship W2096544402A5006839617 @default.
- W2096544402 hasAuthorship W2096544402A5012639421 @default.
- W2096544402 hasAuthorship W2096544402A5013446528 @default.
- W2096544402 hasAuthorship W2096544402A5019577418 @default.
- W2096544402 hasAuthorship W2096544402A5020168973 @default.
- W2096544402 hasAuthorship W2096544402A5022735365 @default.
- W2096544402 hasAuthorship W2096544402A5024436079 @default.
- W2096544402 hasAuthorship W2096544402A5025310668 @default.
- W2096544402 hasAuthorship W2096544402A5028136543 @default.
- W2096544402 hasAuthorship W2096544402A5028153588 @default.
- W2096544402 hasAuthorship W2096544402A5030287491 @default.
- W2096544402 hasAuthorship W2096544402A5031393112 @default.
- W2096544402 hasAuthorship W2096544402A5033536213 @default.