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• W2097002891 abstract "The electrical characteristics of silicon light emitting devices are changed in similar ways by X-ray irradiation and hot carrier stresses. Extended hot carrier stress alone causes coalescence of light emission consistent with junction-localized boron passivation by liberated hydrogen. Optical characterization studies demonstrate the formation of junction micro-environments under hot carrier stress." @default.
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• W2097002891 date "1999-12-01" @default.
• W2097002891 modified "2023-09-23" @default.
• W2097002891 title "Light emission studies of total dose and hot carrier effects on silicon junctions" @default.
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• W2097002891 doi "https://doi.org/10.1109/23.819157" @default.
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