Matches in SemOpenAlex for { <https://semopenalex.org/work/W2097209597> ?p ?o ?g. }
- W2097209597 endingPage "853" @default.
- W2097209597 startingPage "845" @default.
- W2097209597 abstract "Abstract Understanding defects in Cu(In,Ga)(Se,S) 2 (CIGS), especially correlating changes in the film formation process with differences in material properties, photovoltaic (PV) device performance, and defect levels extracted from admittance spectroscopy, is a critical but challenging undertaking due to the complex nature of this polycrystalline compound semiconductor. Here we present a systematic comparative study wherein varying defect density levels in CIGS films were intentionally induced by growing CIGS grains using different selenium activity levels. Material characterization results by techniques including X‐ray diffraction, scanning electron microscopy, transmission electron microscopy, secondary ion mass spectrometry, X‐ray photoelectron spectroscopy, and medium energy ion scattering indicate that this process variation, although not significantly affecting CIGS grain structure, crystal orientation, or bulk composition, leads to enhanced formation of a defective chalcopyrite layer with high density of indium or gallium at copper antisite defects ((In, Ga) Cu ) near the CIGS surface, for CIGS films grown with insufficient selenium supply. This defective layer or the film growth conditions associated with it is further linked with observed current‐voltage characteristics, including rollover and crossover behavior, and a defect state at around 110 meV (generally denoted as the N1 defect) commonly observed in admittance spectroscopy. The impact of the (In, Ga) Cu defects on device PV performance is also established." @default.
- W2097209597 created "2016-06-24" @default.
- W2097209597 creator A5005011448 @default.
- W2097209597 creator A5024058183 @default.
- W2097209597 creator A5028524575 @default.
- W2097209597 creator A5036295864 @default.
- W2097209597 creator A5043049997 @default.
- W2097209597 creator A5060141839 @default.
- W2097209597 creator A5068382775 @default.
- W2097209597 date "2011-08-19" @default.
- W2097209597 modified "2023-10-17" @default.
- W2097209597 title "Defects in Cu(In,Ga)Se2 Chalcopyrite Semiconductors: A Comparative Study of Material Properties, Defect States, and Photovoltaic Performance" @default.
- W2097209597 cites W1499814324 @default.
- W2097209597 cites W1504109566 @default.
- W2097209597 cites W1583894569 @default.
- W2097209597 cites W1672623619 @default.
- W2097209597 cites W1764075295 @default.
- W2097209597 cites W1965142452 @default.
- W2097209597 cites W1968917296 @default.
- W2097209597 cites W1970741147 @default.
- W2097209597 cites W1971024117 @default.
- W2097209597 cites W1981338907 @default.
- W2097209597 cites W1982325884 @default.
- W2097209597 cites W1982769376 @default.
- W2097209597 cites W1984935042 @default.
- W2097209597 cites W1984991618 @default.
- W2097209597 cites W1986279816 @default.
- W2097209597 cites W1986839485 @default.
- W2097209597 cites W1990722187 @default.
- W2097209597 cites W1993430483 @default.
- W2097209597 cites W2000403122 @default.
- W2097209597 cites W2002430065 @default.
- W2097209597 cites W2003079895 @default.
- W2097209597 cites W2005541740 @default.
- W2097209597 cites W2006274429 @default.
- W2097209597 cites W2007667356 @default.
- W2097209597 cites W2007956293 @default.
- W2097209597 cites W2008266778 @default.
- W2097209597 cites W2012673317 @default.
- W2097209597 cites W2018891271 @default.
- W2097209597 cites W2020647886 @default.
- W2097209597 cites W2022741012 @default.
- W2097209597 cites W2024923737 @default.
- W2097209597 cites W2029889346 @default.
- W2097209597 cites W2032019508 @default.
- W2097209597 cites W2033293445 @default.
- W2097209597 cites W2034496632 @default.
- W2097209597 cites W2035435745 @default.
- W2097209597 cites W2038495010 @default.
- W2097209597 cites W2041504208 @default.
- W2097209597 cites W2043614029 @default.
- W2097209597 cites W2044982381 @default.
- W2097209597 cites W2046579051 @default.
- W2097209597 cites W2048699568 @default.
- W2097209597 cites W2050566320 @default.
- W2097209597 cites W2058545706 @default.
- W2097209597 cites W2060775752 @default.
- W2097209597 cites W2064892281 @default.
- W2097209597 cites W2065164939 @default.
- W2097209597 cites W2065893395 @default.
- W2097209597 cites W2075143680 @default.
- W2097209597 cites W2076623759 @default.
- W2097209597 cites W2078084177 @default.
- W2097209597 cites W2078243611 @default.
- W2097209597 cites W2081409501 @default.
- W2097209597 cites W2083868404 @default.
- W2097209597 cites W2084318435 @default.
- W2097209597 cites W2089360142 @default.
- W2097209597 cites W2106475800 @default.
- W2097209597 cites W2109311870 @default.
- W2097209597 cites W2119477056 @default.
- W2097209597 cites W2131512622 @default.
- W2097209597 cites W2134430759 @default.
- W2097209597 cites W2142362129 @default.
- W2097209597 cites W2150710849 @default.
- W2097209597 cites W2160880992 @default.
- W2097209597 cites W2165535650 @default.
- W2097209597 cites W2169611874 @default.
- W2097209597 cites W2171660354 @default.
- W2097209597 doi "https://doi.org/10.1002/aenm.201100344" @default.
- W2097209597 hasPublicationYear "2011" @default.
- W2097209597 type Work @default.
- W2097209597 sameAs 2097209597 @default.
- W2097209597 citedByCount "133" @default.
- W2097209597 countsByYear W20972095972012 @default.
- W2097209597 countsByYear W20972095972013 @default.
- W2097209597 countsByYear W20972095972014 @default.
- W2097209597 countsByYear W20972095972015 @default.
- W2097209597 countsByYear W20972095972016 @default.
- W2097209597 countsByYear W20972095972017 @default.
- W2097209597 countsByYear W20972095972018 @default.
- W2097209597 countsByYear W20972095972019 @default.
- W2097209597 countsByYear W20972095972020 @default.
- W2097209597 countsByYear W20972095972021 @default.
- W2097209597 countsByYear W20972095972022 @default.
- W2097209597 countsByYear W20972095972023 @default.
- W2097209597 crossrefType "journal-article" @default.
- W2097209597 hasAuthorship W2097209597A5005011448 @default.