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• W2097639211 abstract "Low frequency noise measurements have been performed on Al-Si resistors, subjected to high current density (j=2/spl times/10/sup 6/ A/cm/sup 2/), in order to investigate the dependence of the electromigration noise on the structural and geometrical parameters. To this end five groups of samples have been used, each characterized by a different value of the average grain size D. The power spectral density S/sub v/ of the voltage fluctuations across the samples has been measured using test patterns with different widths /spl omega/ and lengths l. It has been found that S/sub v/ shows an exponential dependence on the grain dimension and a linear dependence on the shape factor F=l//spl omega/. The model previously proposed for noise generation has been integrated to take into account the observed dependence of S/sub v/ on D and F.< <ETX xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>></ETX>" @default.
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• W2097639211 date "1994-01-01" @default.
• W2097639211 modified "2023-09-26" @default.
• W2097639211 title "Dependence of electromigration noise on geometrical and structural characteristics in aluminum-based resistors" @default.
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• W2097639211 doi "https://doi.org/10.1109/16.333838" @default.
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