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• W2098678587 abstract "The authors present a test algorithm for finite state machines called branch testing. Based on branch testing, a design-for-test (DFT) method is proposed. Comparisons to other DFT methods show the method to be competitive relative to circuit overhead. A minimum set of paths containing all primary and internal gate-level input/output lines is found. Each of these paths is then sensitized so as to detect all single stuck-at faults. The authors demonstrated that the one-hot encoded FSMs can be easily and thoroughly tested via a simple algorithm. It is demonstrated that the use of scan paths is not necessary if a one-hot encoded state assignment is made. The synthesis and simulation resulting have shown that the package of one-hot encoding and branch testing constitutes a viable design and test approach. >" @default.
• W2098678587 created "2016-06-24" @default.
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• W2098678587 date "1991-06-01" @default.
• W2098678587 modified "2023-09-24" @default.
• W2098678587 title "Automatic test pattern generation with branch testing" @default.
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• W2098678587 doi "https://doi.org/10.1109/12.90257" @default.
• W2098678587 hasPublicationYear "1991" @default.
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