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- W2100024553 abstract "Measurements of the F-center concentration, nF, and M-center concentration, nM, for KCl samples irradiated with 1.5 MeV electrons at low temperatures show that the ratio nM/nF2 for electron irradiation is only one-half that found previously for X-ray irradiated crystals. The electron results are in appreciably better agreement with the value to be expected from a statistical model and an M-band oscillator strength obtained by optical bleaching techniques. The discrepancy between the electron irradiation and X-ray irradiation results is discussed and it is concluded that the statistical model, according to which an M-center appears whenever two F-centers are produced at adjacent sites, may not be adequate to describe F- and M-center introduction at low temperature.Messungen der Konzentrationen nF und nM von F- und M-Zentren in KCl, bestrahlt mit 1,5 MeV Elektronen bei tiefen Temperaturen, zeigen, das das Verhaltnis nM/nF2 bei Elektronenbestrahlung nur halb so gros ist wie bei Rontgenbestrahlung. Die Elektronenergebnisse sind in erheblich besserer Ubereinstimmung mit dem Wert der von einem statistischen Modell und von einer mit anderen optischen Methoden erhaltenen Oszillatorstarke geliefert wird. Wir diskutieren den Unterschied zwischen Elektronenbestrahlung und Rontgenbestrahlung und schliesen, das das statistische Modell, bei dem ein M-Zentrum erscheint, wenn zwei F-Zentren als Nachbarn produziert werden, nicht immer eine hinreichende Erklarung der F- und M-Zentren-Erzeugung liefert." @default.
- W2100024553 created "2016-06-24" @default.
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- W2100024553 date "1965-01-01" @default.
- W2100024553 modified "2023-09-27" @default.
- W2100024553 title "F-Aggregate Center Formation at Low Temperatures in KCl" @default.
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- W2100024553 doi "https://doi.org/10.1002/pssb.19650100110" @default.
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