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- W2101075913 abstract "Defect analysis of CMOS circuits is performed to show the test effectiveness of IDDQ testing. Results show that the test patterns generated by the stuck-fault model can detect nearly 100% of stuck-at faults and a very high percentage of delay faults and stuck-open faults. The IDDQ testing technique can detect gate oxide shorts, bridging faults, and some delay faults. However, IDDQ tests do not guarantee the improvement of stuck-at fault test coverage and they cannot detect the majority of delay defects and open defects.< <ETX xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>></ETX>" @default.
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- W2101075913 date "2002-12-09" @default.
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- W2101075913 title "Can IDDQ test replace conventional stuck-fault test?" @default.
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- W2101075913 doi "https://doi.org/10.1109/cicc.1991.164121" @default.
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