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- W2101309301 abstract "The effects of radiation exposure on the performance of CMOS integrated circuits are difficult to predict and to simulate due to the bias-dependent device parameter shifts. Simulation methodologies for identification of failure mechanisms and performance estimation are developed. These simulation algorithms are implemented in the PARA simulator for switch-level simulation of radiation effects. Simulation results for test circuits are presented that prove that accurate estimations are possible without CPU-intensive simulation programs.< <ETX xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>></ETX>" @default.
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- W2101309301 date "1989-01-01" @default.
- W2101309301 modified "2023-09-24" @default.
- W2101309301 title "Switch-level simulation of total dose effects on CMOS VLSI circuits" @default.
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- W2101309301 doi "https://doi.org/10.1109/43.35545" @default.
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