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• W2101668929 endingPage "2892" @default.
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• W2101668929 abstract "An extraction method to obtain the induced gate noise (i~/sub g/~/sup 2/~) channel noise (i~/sub d/~/sup 2/~), and their cross correlation (i~/sub g/~i~/sub d/~*~) in submicron MOSFETs directly from scattering and RF noise measurements has been presented and verified by measurements. In addition, the extracted induced gate noise, channel noise, and their correlation in MOSFETs fabricated in 0.18-/spl mu/m CMOS process versus frequencies, bias conditions, and channel lengths are presented and discussed." @default.
• W2101668929 created "2016-06-24" @default.
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• W2101668929 date "2001-01-01" @default.
• W2101668929 modified "2023-09-23" @default.
• W2101668929 title "Extraction of the induced gate noise, channel noise, and their correlation in submicron MOSFETs from RF noise measurements" @default.
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• W2101668929 doi "https://doi.org/10.1109/16.974722" @default.
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