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• W2101701629 abstract "Abstracr-The application cross section is a parameter used to characterize the system’s SEU vulnerability, but does not give, in a direct way, tbe system’s reliability. Reliability prediction of a system exposed to SEU can be improved with the knowledge of the system’s Time To Failure, (TTF), probability distribution function. This work presents two new methods suitable to provide this information. The first one is based on the construction of a function named the Failure Map Function (FMIF). PMF contains the information needed to calculate all the TTF statistical properties by means of numerical procedures. For the cases where the FMF function is difficult to obtain, a second method is presented which consists in injecting SEUs at a rate several orders of magnitude higher than the real rate. A histogram of the TTF random variable for the accelerated process is obtained. The system’s reliability can then be derived by means of statistical and numerical procedures" @default.
• W2101701629 created "2016-06-24" @default.
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• W2101701629 date "2003-01-01" @default.
• W2101701629 modified "2023-09-27" @default.
• W2101701629 title "Failure map functions and accelerated MTTF tests: now approaches for improving the reliability estimation in systems exposed to seus" @default.
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• W2101701629 hasPublicationYear "2003" @default.
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