Matches in SemOpenAlex for { <https://semopenalex.org/work/W2102640871> ?p ?o ?g. }
- W2102640871 endingPage "604" @default.
- W2102640871 startingPage "586" @default.
- W2102640871 abstract "A comprehensive description of a modular optoelectronic measurement system for the characterization of high-frequency microelectronic devices and circuits is presented. Depending on application, specific techniques to generate, synchronize to, and detect high-frequency electric signals are combined covering a frequency range of more than three orders of magnitudes from 2 to 4000 GHz. We discuss on-chip electric-pulse generation by freely positionable photoconductive probes and by direct optical excitation of active devices. Alternatively, for measurements with external, electronically generated signals, the system is laid out to lock onto periodic signals of arbitrary frequency employed as clock signal for the circuit under test. With respect to detection, the following approaches are discussed: sampling with freely positionable electrooptic and photoconductive probe tips, and truly (probe-tip-free) all-optical testing based on the field-dependent optical nonlinearity of the circuit's substrate material. The probes are characterized concerning time resolution, linearity, sensitivity, and invasiveness. We demonstrate with a number of examples that the combination of the various modules allows one to optimize the approach to a specific testing problem. Measurements of the linear and nonlinear behavior of active and passive devices as well as circuits are presented. The electric field, respectively potential, is measured locally (point measurements) or in its spatial distribution (field mapping) both in the near and far field." @default.
- W2102640871 created "2016-06-24" @default.
- W2102640871 creator A5024391222 @default.
- W2102640871 creator A5029521004 @default.
- W2102640871 creator A5054826618 @default.
- W2102640871 creator A5058646166 @default.
- W2102640871 creator A5059307761 @default.
- W2102640871 creator A5060868403 @default.
- W2102640871 creator A5086554516 @default.
- W2102640871 creator A5087318317 @default.
- W2102640871 date "1996-01-01" @default.
- W2102640871 modified "2023-10-17" @default.
- W2102640871 title "Optoelectronic on-chip characterization of ultrafast electric devices: Measurement techniques and applications" @default.
- W2102640871 cites W1518504911 @default.
- W2102640871 cites W1573132838 @default.
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- W2102640871 cites W2048420615 @default.
- W2102640871 cites W2049671995 @default.
- W2102640871 cites W2050536843 @default.
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- W2102640871 cites W2092948306 @default.
- W2102640871 cites W2093139915 @default.
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- W2102640871 cites W2096242728 @default.
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- W2102640871 cites W2101882882 @default.
- W2102640871 cites W2104838703 @default.
- W2102640871 cites W2109336395 @default.
- W2102640871 cites W2111660833 @default.
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- W2102640871 cites W2115181906 @default.
- W2102640871 cites W2125230693 @default.
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- W2102640871 cites W2157119388 @default.
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- W2102640871 cites W2171982968 @default.
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- W2102640871 cites W2102288776 @default.
- W2102640871 doi "https://doi.org/10.1109/2944.571758" @default.
- W2102640871 hasPublicationYear "1996" @default.
- W2102640871 type Work @default.
- W2102640871 sameAs 2102640871 @default.
- W2102640871 citedByCount "58" @default.