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• W2103171152 abstract "Thermal feedback (TF) is an important aspect for the thermal management of semiconductor devices and high-power density integrated circuits. Different features of positive and negative TF in transistors are reviewed and summarized for the macroscopic domain. The thermal feedback mechanism is applied to the microscopic domain of noise fluctuations in semiconductor devices. It is argued that TF may be responsible for a major part of 1/ <tex xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>f</tex> flicker or excess noise. Some experimental evidence is presented which supports this thermal feedback 1/ <tex xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>f</tex> -noise theory for bipolar and MOS field effect transistors. Device and circuit design rules for the minimization of transmitter noise are given." @default.
• W2103171152 created "2016-06-24" @default.
• W2103171152 creator A5047859834 @default.
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• W2103171152 date "1970-09-01" @default.
• W2103171152 modified "2023-10-16" @default.
• W2103171152 title "Thermal feedback in power semiconductor devices" @default.
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• W2103171152 doi "https://doi.org/10.1109/t-ed.1970.17072" @default.
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