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- W2103228806 abstract "8 mol% yttria‐stabilized zirconia (8 YSZ ) is an extensively studied solid electrolyte. But there is no consistency in the reported ionic conductivity values of 8YSZ thin films. Interfacial segregation in YSZ thin films can affect its ionic conductivity by locally altering the surface chemistry. This article presents the effects of annealing temperature and film thickness on free surface yttria segregation behavior in 8YSZ thin film by Angle Resolved XPS and its influence on the ionic conductivity of sputtered 8YSZ thin films. Surface yttria concentration of about 32, 20, and 9 mol% have been found in 40 nm 8YSZ films annealed at 1273, 1173, and 1073 K, respectively. Yttria segregation is found to increase with increase in annealing temperature and film thickness. Ionic conductivities of 0.23, 0.16, and 0.08 Scm −1 are observed at 923 K for 40 nm 8YSZ films annealed at 1073, 1173, and 1273 K, respectively. The decrease in conductivity with increase in annealing temperature is attributed to the increased yttria segregation with annealing. Neither segregation nor film thickness is found to affect the activation energy of oxygen ion conduction. Target purity is found to play a key role in determining free surface yttria segregation in 8YSZ thin films." @default.
- W2103228806 created "2016-06-24" @default.
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- W2103228806 date "2015-07-28" @default.
- W2103228806 modified "2023-09-27" @default.
- W2103228806 title "Investigation of Annealing Induced Yttria Segregation in Sputtered Yttria‐Stabilized Zirconia Thin Films" @default.
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- W2103228806 doi "https://doi.org/10.1111/jace.13777" @default.
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