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• W2103379178 abstract "A built-in self-test technique for testing digital logic circuits for single-events has been developed. The BIST technique can be used for single-event testing in any conventional laboratory to evaluate the circuit level response to SEs. Experimental and simulation results for multiple technology nodes show the feasibility of this approach to test circuits, with the added advantages of reduced testing time and cost." @default.
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• W2103379178 date "2008-12-01" @default.
• W2103379178 modified "2023-10-16" @default.
• W2103379178 title "A Built-In Self-Test (BIST) Technique for Single-Event Testing in Digital Circuits" @default.
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• W2103379178 doi "https://doi.org/10.1109/tns.2008.2006499" @default.
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