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- W2103669252 abstract "A Bayesian/Maximum Entropy (MaxEnt) method for determining crystallite size distributions and morphologies from size-broadened X-ray line profiles is presented. This method will be used in certifying a nanocrystallite-size standard reference material (SRM) being developed at the National Institute of Standards and Technology (NIST). The proposed SRM will assist in ensuring that uniform procedures in quantifying the microstructure of nanocrystallites from X-ray line profile data are developed. This will become increasingly important as emerging nanotechnology applications begin to call for crystallites designed to have particular morphology and size distributions." @default.
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- W2103669252 date "2004-01-01" @default.
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- W2103669252 title "A Bayesian/Maximum Entropy Method for the Certification of a Nanocrystallite-Size NIST Standard Reference Material" @default.
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- W2103669252 doi "https://doi.org/10.1007/978-3-662-06723-9_8" @default.
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