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• W2103993860 endingPage "2040" @default.
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• W2103993860 abstract "A comprehensive physical model for the analysis, characterization, and design of 4H-silicon carbide (SiC) MOSFETs has been developed. The model has been verified for an extensive range of bias conditions and temperatures. It incorporates details of interface trap densities, Coulombic interface trap scattering, surface roughness scattering, phonon scattering, velocity saturation, and their dependences on bias and temperature. The physics-based models were implemented into our device simulator that is tailored for 4H-SiC MOSFET analysis. By using a methodology of numerical modeling, simulation, and close correlation with experimental data, values for various physical parameters governing the operation of 4H-SiC MOSFETs, including the temperature-dependent interface trap density of states, the root-mean-square height and correlation length of the surface roughness, and the electron saturation velocity in the channel and its dependence on temperature, have been extracted. Coulomb scattering and surface roughness scattering limit surface mobility for a wide range of temperatures in the subthreshold and linear regions of device operation, whereas the saturation velocity and the high-field mobility limit current in the saturation region." @default.
• W2103993860 created "2016-06-24" @default.
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• W2103993860 date "2008-08-01" @default.
• W2103993860 modified "2023-10-16" @default.
• W2103993860 title "A Physical Model of High Temperature 4H-SiC MOSFETs" @default.
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• W2103993860 doi "https://doi.org/10.1109/ted.2008.926665" @default.
• W2103993860 hasPublicationYear "2008" @default.
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