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- W2104192898 abstract "We present a practical, systematical method for the evaluation of the soft error rate (SER) of microelectronic devices. Existing methodologies, practices and tools are integrated in a common approach while highlighting the need for specific data or tools. The showcased method is particularly adapted for evaluating the SER of very complex microelectronic devices by engineers confronted to increasingly demanding reliability requirements." @default.
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- W2104192898 date "2008-07-01" @default.
- W2104192898 modified "2023-10-01" @default.
- W2104192898 title "A Systematical Method of Quantifying SEU FIT" @default.
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- W2104192898 doi "https://doi.org/10.1109/iolts.2008.62" @default.
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