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- W2104557428 abstract "In this letter, the feasibility of split-capacitance–voltage ( <tex xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>$C$</tex> – <tex xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>$V$</tex> ) measurements in the RF range is demonstrated. These RF/split- <tex xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>$C$</tex> – <tex xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>$V$</tex> measurements show excellent agreement with the values obtained by the low-frequency conventional technique but without presenting any noticeable degradation due to gate leakage." @default.
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- W2104557428 date "2006-09-01" @default.
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- W2104557428 title "RF Split Capacitance–Voltage Measurements of Short-Channel and Leaky MOSFET Devices" @default.
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- W2104557428 doi "https://doi.org/10.1109/led.2006.881089" @default.
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