Matches in SemOpenAlex for { <https://semopenalex.org/work/W2104735844> ?p ?o ?g. }
Showing items 1 to 76 of
76
with 100 items per page.
- W2104735844 abstract "Only a few years ago, the primary method of cost reduction and productivity improvement in the semiconductor industry was increasing manufacturing yields throughout the process. Many of the remarkable reliability improvements realized over the past decade have come about as a result of actions that were originally taken primarily to improve device yields. Obviously, the practice of productivity improvement through yield enhancement is limited to the attainment of 100% yield, at which point some other mechanism must be employed. Traditionally, new products have been introduced to manufacturing at a point of relative immaturity, and semiconductor producers have relied on the traditional `learning curve' method of yield improvement to attain profitable levels of manufacturing yield. Recently, results of a survey of several fabs by a group of University of California at Berkeley researchers in the Competitive Semiconductor Manufacturing Program indicate that most factories learn at about the same rate after startup, in terms of both line yield and defectivity. If this is indeed generally true, then the most competitive factor is the one that starts with the highest yield, and it is difficult to displace a leader once his lead has been established. The two observations made above carry enormous implications for the semiconductor development or manufacturing professional. First, one must achieve very high yields in order to even play the game. Second, the achievement of competitive yields over time in the life of a factory is determined even before the factory is opened, in the planning and development phase. Third, and perhaps most uncomfortable for those of us who have relied on yield improvement as a cost driver, the winners of the nineties will find new levers to drive costs down, having already gotten the benefit of very high yield. This paper looks at the question of how the winners will achieve the critical measures of success, high initial yield and utilization of other cost reduction levers." @default.
- W2104735844 created "2016-06-24" @default.
- W2104735844 creator A5033659307 @default.
- W2104735844 date "1994-09-14" @default.
- W2104735844 modified "2023-09-26" @default.
- W2104735844 title "<title>Yield: it's now an entitlement</title>" @default.
- W2104735844 doi "https://doi.org/10.1117/12.186736" @default.
- W2104735844 hasPublicationYear "1994" @default.
- W2104735844 type Work @default.
- W2104735844 sameAs 2104735844 @default.
- W2104735844 citedByCount "0" @default.
- W2104735844 crossrefType "proceedings-article" @default.
- W2104735844 hasAuthorship W2104735844A5033659307 @default.
- W2104735844 hasConcept C117671659 @default.
- W2104735844 hasConcept C119599485 @default.
- W2104735844 hasConcept C127413603 @default.
- W2104735844 hasConcept C134121241 @default.
- W2104735844 hasConcept C13736549 @default.
- W2104735844 hasConcept C144133560 @default.
- W2104735844 hasConcept C160671074 @default.
- W2104735844 hasConcept C162324750 @default.
- W2104735844 hasConcept C191897082 @default.
- W2104735844 hasConcept C192562407 @default.
- W2104735844 hasConcept C199360897 @default.
- W2104735844 hasConcept C204983608 @default.
- W2104735844 hasConcept C21547014 @default.
- W2104735844 hasConcept C2524010 @default.
- W2104735844 hasConcept C28719098 @default.
- W2104735844 hasConcept C31258907 @default.
- W2104735844 hasConcept C33923547 @default.
- W2104735844 hasConcept C40149104 @default.
- W2104735844 hasConcept C40700 @default.
- W2104735844 hasConcept C41008148 @default.
- W2104735844 hasConcept C50522688 @default.
- W2104735844 hasConcept C66018809 @default.
- W2104735844 hasConcept C94982200 @default.
- W2104735844 hasConceptScore W2104735844C117671659 @default.
- W2104735844 hasConceptScore W2104735844C119599485 @default.
- W2104735844 hasConceptScore W2104735844C127413603 @default.
- W2104735844 hasConceptScore W2104735844C134121241 @default.
- W2104735844 hasConceptScore W2104735844C13736549 @default.
- W2104735844 hasConceptScore W2104735844C144133560 @default.
- W2104735844 hasConceptScore W2104735844C160671074 @default.
- W2104735844 hasConceptScore W2104735844C162324750 @default.
- W2104735844 hasConceptScore W2104735844C191897082 @default.
- W2104735844 hasConceptScore W2104735844C192562407 @default.
- W2104735844 hasConceptScore W2104735844C199360897 @default.
- W2104735844 hasConceptScore W2104735844C204983608 @default.
- W2104735844 hasConceptScore W2104735844C21547014 @default.
- W2104735844 hasConceptScore W2104735844C2524010 @default.
- W2104735844 hasConceptScore W2104735844C28719098 @default.
- W2104735844 hasConceptScore W2104735844C31258907 @default.
- W2104735844 hasConceptScore W2104735844C33923547 @default.
- W2104735844 hasConceptScore W2104735844C40149104 @default.
- W2104735844 hasConceptScore W2104735844C40700 @default.
- W2104735844 hasConceptScore W2104735844C41008148 @default.
- W2104735844 hasConceptScore W2104735844C50522688 @default.
- W2104735844 hasConceptScore W2104735844C66018809 @default.
- W2104735844 hasConceptScore W2104735844C94982200 @default.
- W2104735844 hasLocation W21047358441 @default.
- W2104735844 hasOpenAccess W2104735844 @default.
- W2104735844 hasPrimaryLocation W21047358441 @default.
- W2104735844 hasRelatedWork W1910899810 @default.
- W2104735844 hasRelatedWork W1926977277 @default.
- W2104735844 hasRelatedWork W1956398432 @default.
- W2104735844 hasRelatedWork W1966924987 @default.
- W2104735844 hasRelatedWork W2000493776 @default.
- W2104735844 hasRelatedWork W2010326024 @default.
- W2104735844 hasRelatedWork W2068401658 @default.
- W2104735844 hasRelatedWork W2120082766 @default.
- W2104735844 hasRelatedWork W2124428087 @default.
- W2104735844 hasRelatedWork W2899084033 @default.
- W2104735844 isParatext "false" @default.
- W2104735844 isRetracted "false" @default.
- W2104735844 magId "2104735844" @default.
- W2104735844 workType "article" @default.