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- W2105215328 abstract "A three-dimensional (3D) technology computer-aided design (TCAD) model was used to simulate charge collection at multiple nodes. Guard contacts are shown to mitigate the charge collection and to more quickly restore the well potential, especially in PMOS devices. Mitigation of the shared charge collection in NMOS devices is accomplished through isolation of the P-wells using a triple-well option. These techniques have been partially validated through heavy-ion testing of three versions of flip-flop shift register chains." @default.
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- W2105215328 date "2005-12-01" @default.
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- W2105215328 title "HBD layout isolation techniques for multiple node charge collection mitigation" @default.
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- W2105215328 doi "https://doi.org/10.1109/tns.2005.860718" @default.
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