FRINK Linked Data Fragments server

Matches in SemOpenAlex for { <https://semopenalex.org/work/W2105502497> ?p ?o ?g. }

• W2105502497 abstract "The technological development is enabling production of increasingly complex electronic systems. All those systems must be verified and tested to guarantee correct behavior. As the complexity grows, testing is becoming one of the most significant factors that contribute to the final product cost. The established low-level methods for hardware testing are not any more sufficient and more work has to be done at abstraction levels higher than the classical gate and register-transfer levels. This thesis reports on one such work that deals in particular with high-level test generation and design for testability techniques. The contribution of this thesis is twofold. First, we investigate the possibilities of generating test vectors at the early stages of the design cycle, starting directly from the behavioral description and with limited knowledge about the final implementation architecture. We have developed for this purpose a novel hierarchical test generation algorithm and demonstrated the usefulness of the generated tests not only for manufacturing test but also for testability analysis. The second part of the thesis concentrates on design for testability. As testing of modern complex electronic systems is a very expensive procedure, special structures for simplifying this process can be inserted into the system during the design phase. We have proposed for this purpose a novel hybrid built-in self-test architecture, which makes use of both pseudorandom and deterministic test patterns, and is appropriate for modern system-on-chip designs. We have also developed methods for optimizing hybrid built-in self-test solutions and demonstrated the feasibility and efficiency of the proposed technique." @default.
• W2105502497 created "2016-06-24" @default.
• W2105502497 creator A5034460368 @default.
• W2105502497 date "2002-01-01" @default.
• W2105502497 modified "2023-09-28" @default.
• W2105502497 title "High-Level Test Generation and Built-In Self-Test Techniques for Digital Systems" @default.
• W2105502497 cites W138977489 @default.
• W2105502497 cites W1480210121 @default.
• W2105502497 cites W1515082873 @default.
• W2105502497 cites W1531820794 @default.
• W2105502497 cites W1539901529 @default.
• W2105502497 cites W1540606590 @default.
• W2105502497 cites W1541790472 @default.
• W2105502497 cites W1554885925 @default.
• W2105502497 cites W1559215823 @default.
• W2105502497 cites W1567413682 @default.
• W2105502497 cites W1570613497 @default.
• W2105502497 cites W1591760011 @default.
• W2105502497 cites W1593445040 @default.
• W2105502497 cites W1677852443 @default.
• W2105502497 cites W1832971077 @default.
• W2105502497 cites W1910771831 @default.
• W2105502497 cites W1951775667 @default.
• W2105502497 cites W1979092306 @default.
• W2105502497 cites W1994143452 @default.
• W2105502497 cites W2021492392 @default.
• W2105502497 cites W2022078312 @default.
• W2105502497 cites W2024060531 @default.
• W2105502497 cites W2030106932 @default.
• W2105502497 cites W2046314918 @default.
• W2105502497 cites W2049695835 @default.
• W2105502497 cites W2063435983 @default.
• W2105502497 cites W2084792706 @default.
• W2105502497 cites W2098112833 @default.
• W2105502497 cites W2104918553 @default.
• W2105502497 cites W2114951958 @default.
• W2105502497 cites W2120819183 @default.
• W2105502497 cites W2121093655 @default.
• W2105502497 cites W2124628240 @default.
• W2105502497 cites W2126693329 @default.
• W2105502497 cites W2132086613 @default.
• W2105502497 cites W2133269209 @default.
• W2105502497 cites W2137114625 @default.
• W2105502497 cites W2146158110 @default.
• W2105502497 cites W2147710469 @default.
• W2105502497 cites W2152040677 @default.
• W2105502497 cites W2152279620 @default.
• W2105502497 cites W2152520168 @default.
• W2105502497 cites W2157755550 @default.
• W2105502497 cites W2157986239 @default.
• W2105502497 cites W2166425034 @default.
• W2105502497 cites W2169790199 @default.
• W2105502497 cites W2171695647 @default.
• W2105502497 cites W2503952136 @default.
• W2105502497 cites W2767913947 @default.
• W2105502497 cites W2979393211 @default.
• W2105502497 cites W3014469364 @default.
• W2105502497 cites W3016228715 @default.
• W2105502497 cites W3016545513 @default.
• W2105502497 cites W3081177992 @default.
• W2105502497 cites W3097682725 @default.
• W2105502497 cites W3111098974 @default.
• W2105502497 cites W3113590716 @default.
• W2105502497 cites W3203992401 @default.
• W2105502497 cites W572866674 @default.
• W2105502497 cites W598730865 @default.
• W2105502497 hasPublicationYear "2002" @default.
• W2105502497 type Work @default.
• W2105502497 sameAs 2105502497 @default.
• W2105502497 citedByCount "5" @default.
• W2105502497 crossrefType "journal-article" @default.
• W2105502497 hasAuthorship W2105502497A5034460368 @default.
• W2105502497 hasConcept C107683887 @default.
• W2105502497 hasConcept C111472728 @default.
• W2105502497 hasConcept C113775141 @default.
• W2105502497 hasConcept C115903868 @default.
• W2105502497 hasConcept C119599485 @default.
• W2105502497 hasConcept C124304363 @default.
• W2105502497 hasConcept C127413603 @default.
• W2105502497 hasConcept C134146338 @default.
• W2105502497 hasConcept C138885662 @default.
• W2105502497 hasConcept C149091818 @default.
• W2105502497 hasConcept C149635348 @default.
• W2105502497 hasConcept C151730666 @default.
• W2105502497 hasConcept C17626397 @default.
• W2105502497 hasConcept C186846655 @default.
• W2105502497 hasConcept C190874656 @default.
• W2105502497 hasConcept C199360897 @default.
• W2105502497 hasConcept C200601418 @default.
• W2105502497 hasConcept C2777267654 @default.
• W2105502497 hasConcept C2777904410 @default.
• W2105502497 hasConcept C2780980493 @default.
• W2105502497 hasConcept C41008148 @default.
• W2105502497 hasConcept C51234621 @default.
• W2105502497 hasConcept C7166840 @default.
• W2105502497 hasConcept C7435765 @default.
• W2105502497 hasConcept C86803240 @default.
• W2105502497 hasConceptScore W2105502497C107683887 @default.
• W2105502497 hasConceptScore W2105502497C111472728 @default.
• W2105502497 hasConceptScore W2105502497C113775141 @default.

• next