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- W2105828508 abstract "80 years after its discovery X-ray diffraction presents itself as an outstanding method in structure determination which allows the most safe and accurate geometrical data of chemical structures to obtain compared to most other experimental methods. The major innovations in the recent past and the present state of crystal structure analysis are described together with some examples in inorganic and organic chemistry, including the use of synchrotron radiation. A variety of additional applications can be considered if the diffraction experiment is executed at low temperatures. Nitrogen gas stream devices and closed cycle helium cryostats are compared and their advantages/disadvantages are discussed. Finally some applications such as low temperature crystallization, temperature dependent structure analysis down to 20 K and deformation density work are illustrated. 80 Jahre nach ihrer Entdeckung präsentiert sich die Röntgenstrukturanalyse als eine ausgezeichnete Methode der Strukturbestimmung, mit der im Vergleich zu anderen experimentellen Techniken die sichersten, genauesten und umfangreichsten geometrischen Daten chemischer Strukturen erhalten werden können. Nach einem Überblick über die wichtigsten Innovationen in den letzten Jahren wird der gegenwärtige Stand der Kristallstrukturanalyse dargestellt mit Anwendungsbeispielen aus der anorganischen und organischen Chemie, einschließlich der Nutzung von Synchrontronstrahlung. Eine Vielzahl weiterer Anwendungen ist möglich, wenn das Beugungsexperiment bei tiefen Temperaturen stattfindet. Stickstoff-Gasstromanlagen und geschlossene Helium-Kryostaten werden verglichen und ihre Vor- bzw. Nachteile diskutiert. Schließlich werden Anwendungen wie Tieftemperaturkristallisation, temperaturabhängige Strukturanalyse (bis 20 K) und Deformationsdichtebestimmung behandelt." @default.
- W2105828508 created "2016-06-24" @default.
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- W2105828508 date "1993-01-01" @default.
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- W2105828508 title "Crystal Structure Analysis at Normal and Low Temperature Conditions" @default.
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- W2105828508 doi "https://doi.org/10.1002/crat.2170280603" @default.
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