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- W2106767510 abstract "Deep sub-micron CMOS offers relatively low RF performance at mm-wave frequencies compared with III-V technologies and the high levels of process variation further exacerbate design margins and poor performance. Instead of optimizing mm-wave circuits for performance at design time, we instead adopt a “maximum tune-ability” approach in which the mm-wave front-end circuitry is made highly tunable and optimized at run-time by digital control and optimization algorithms to overcome process variation effects." @default.
- W2106767510 created "2016-06-24" @default.
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- W2106767510 date "2013-06-01" @default.
- W2106767510 modified "2023-09-29" @default.
- W2106767510 title "Calibration and optimization of CMOS mm-wave transceivers" @default.
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- W2106767510 doi "https://doi.org/10.1109/mwsym.2013.6697803" @default.
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