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- W2108182008 abstract "In this work, we study the impact of the effective area of the Pseudo-Transistor when this method is combined with Split-C(V) measurements for the extraction of carrier mobility in bare SOI wafers. The dependence of the effective surface with the frequency of the AC signal and the probe inter-distance is analyzed. A model to calculate the area in single and multiple-needle configurations is proposed and discussed with experimental results." @default.
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- W2108182008 date "2013-05-02" @default.
- W2108182008 modified "2023-09-24" @default.
- W2108182008 title "Determination of Effective Capacitance Area for Pseudo-MOSFET Based Characterization of Bare SOI Wafers by Split-C(V) Measurements" @default.
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- W2108182008 doi "https://doi.org/10.1149/05305.0209ecst" @default.
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