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• W2108287476 abstract "On an upward curve? The curvature of an elastically deformed nanowire pinned to a flat surface contains information about the maximum static friction force, and hence the shear stress, between the nanowire and the surface. Here, InAs nanowires are bent in a controlled manner using the tip of an atomic force microscope (see image). The shear stress can be obtained from a simple analysis according to the standard theory of elasticity." @default.
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• W2108287476 date "2007-07-26" @default.
• W2108287476 modified "2023-10-09" @default.
• W2108287476 title "Shear Stress Measurements on InAs Nanowires by AFM Manipulation" @default.
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• W2108287476 doi "https://doi.org/10.1002/smll.200700052" @default.
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