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• W2109283496 abstract "Native or process-induced defective states may significantly affect the transport properties of silicon carbide. It is then of fundamental importance to detect them and, possibly, to identify their origin. This paper deals with the defect analysis of silicon carbide using capacitance transient spectroscopy. Electrical characterization can evaluate transport mechanisms and diode quality. Deep levels found can be ascribed to impurities introduced during growth and metallization." @default.
• W2109283496 created "2016-06-24" @default.
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• W2109283496 date "2002-11-08" @default.
• W2109283496 modified "2023-09-23" @default.
• W2109283496 title "Defective state analysis in silicon carbide" @default.
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• W2109283496 doi "https://doi.org/10.1109/asdam.2000.889472" @default.
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