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- W2109808324 abstract "In this paper theoretical basis for VLSI chip defect diagnosis and defect location are discussed and a simple diagnosability measure is introduced. The proposed framework can be used to evaluate quality of defect diagnosis oriented testing vectors, as well as, for the development of test generation algorithms.< <ETX xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>></ETX>" @default.
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- W2109808324 date "1991-01-01" @default.
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- W2109808324 title "Defect and design error location procedure-theoretical basis" @default.
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- W2109808324 doi "https://doi.org/10.1109/isvd.1991.185124" @default.
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