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- W2109879890 abstract "Self-Test strategies for testing embedded processors are increasingly diffused. In this paper, we describe a set of self-test techniques tackling dual issue embedded processors. The paper details how to produce test programs suitable to detect stuck-at faults in computational modules belonging to dual issue processors. The proposed technique is aimed at extending single issue test programs; results are illustrated for a 32-bit processor included in an automotive System-on-Chip manufactured by STMicroelectronics and implementing a dual issue strategy with static dispatch of instructions." @default.
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- W2109879890 date "2015-05-01" @default.
- W2109879890 modified "2023-10-04" @default.
- W2109879890 title "Software-based self-test techniques of computational modules in dual issue embedded processors" @default.
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- W2109879890 doi "https://doi.org/10.1109/ets.2015.7138730" @default.
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