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• W2110551097 abstract "The kinetic roughening behavior of vicinal Si(001) surfaces is studied with scanning tunneling microscopy. By analyzing the height-height correlation function of the Si layers that have been grown we found, in the case of islands growth, an algebraic roughening behavior with a roughness exponent of 0.68 ± 0.05. In the step flow mode, however, we found non-algebraic roughening behavior." @default.
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• W2110551097 date "1994-05-01" @default.
• W2110551097 modified "2023-09-27" @default.
• W2110551097 title "Kinetic roughening of vicinal Si(001)" @default.
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• W2110551097 doi "https://doi.org/10.1016/0039-6028(94)90468-5" @default.
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