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- W2111672023 abstract "We present a methodology to detect and measure the signal overshoots occurring on the interconnects of high-speed system-on-chips. Overshoots are known to inject hot-carriers into the gate oxide which cause permanent degradation of MOSFET transistor performance over time. We propose a built-in chip mechanism to detect overshoots, collect the occurrence information and scan them out efficiently and inexpensively for built-in self-test, reliability analysis and diagnosis." @default.
- W2111672023 created "2016-06-24" @default.
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- W2111672023 date "2002-11-13" @default.
- W2111672023 modified "2023-09-25" @default.
- W2111672023 title "Built-in-chip testing of voltage overshoots in high-speed SoCs" @default.
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- W2111672023 doi "https://doi.org/10.1109/vts.2001.923426" @default.
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