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- W2111785162 abstract "New methodologies based on functional testing and built-in self-test can narrow the gap between necessary solutions and existing techniques for processor validation and testing. We present a versatile automatic functional test generation methodology for microprocessors. The generated assembly instruction sequences can be applied to both design validation and manufacturing test, especially in high speed native mode. All the functional capabilities of complex processors can be exercised, leading to high quality validation sequences and manufacturing tests with high fault coverage. The tests can also be applied in a built-in self-test fashion. Experimental results on two microprocessors show that this method is very effective in generating high quality manufacturing tests as well as in functional design validation." @default.
- W2111785162 created "2016-06-24" @default.
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- W2111785162 date "2002-11-27" @default.
- W2111785162 modified "2023-09-26" @default.
- W2111785162 title "Native mode functional test generation for processors with applications to self test and design validation" @default.
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- W2111785162 doi "https://doi.org/10.1109/test.1998.743296" @default.
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