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- W2111785637 abstract "We study multi-bit upsets (MBU) in 65 nm SOI SRAMs. Proton beam and thorium foil experiments demonstrate that SOI SRAMs have lower soft error rate than bulk SRAMs. Monte Carlo SER simulations show that SOI SRAMs have a lower fraction of MBU than bulk SRAMs. The probability of MBU correlates with the spacing of sensitive devices in neighboring cells." @default.
- W2111785637 created "2016-06-24" @default.
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- W2111785637 date "2008-04-01" @default.
- W2111785637 modified "2023-09-27" @default.
- W2111785637 title "Multi-bit upsets in 65nm SOI SRAMs" @default.
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- W2111785637 doi "https://doi.org/10.1109/relphy.2008.4558885" @default.
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